CSRC approves Lianxun Instruments' registration for the Science and Technology Innovation Board IPO.

On January 29th, the China Securities Regulatory Commission issued the "Approval for the Initial Public Offering of Shares of Suzhou Lianxun Instrument Co., Ltd.". It is reported that Lianxun Instrument plans to list on the Shanghai Stock Exchange's Science and Technology Innovation Board, with CITIC SEC as the sponsor institution, aiming to raise 1.954 billion yuan. According to the prospectus, Lianxun Instrument is a leading domestic high-end testing equipment company, specializing in the research, development, manufacturing, sales, and service of electronic measurement instruments and semiconductor testing equipment. It provides core testing equipment with high speed, precision, and efficiency for global users in the fields of high-speed communication and semiconductor, helping advance product development and production efficiency in the frontier technology industries such as artificial intelligence, new energy, and semiconductor. The company's electronic measurement instruments include communication testing instruments and electrical performance testing instruments. Communication testing instruments are mainly used for optical communication testing, including core testing instruments such as sampling oscilloscopes, clock recovery units, and error analyzers. Electrical performance testing instruments mainly include precision source meters and low leakage current switch matrices, widely used in high-precision electrical testing in the fields of communication and semiconductor. The company's semiconductor testing equipment includes optical-electronic device testing equipment for optical communication testing (CoC optical chip aging testing system, optical chip KGD sorting testing system, silicon optical wafer testing system), power device testing equipment for power device testing (wafer-level aging system, power chip KGD sorting testing system), and electrical performance testing equipment for semiconductor IC testing (WAT tester and wafer-level reliability testing system).